Question
Explain the working of Atomic Force Microscopy (AFM) with suitable diagram. List out the advantages and Applications of AFM.
Answer :
Word Count : 277
Atomic Force Microscopy (AFM) is a high-resolution scanning probe microscopy technique used to study surface morphology at nanoscale resolution, especially useful in nanotechnology applications in energy and environment research. AFM works on the principle of interatomic forces between a sharp probe tip and the sample surface. The system mainly consists of a cantilever with a ______ ________ ___ ___ ____ ____ ___.
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Atomic Force Microscopy (AFM) is a high-resolution scanning probe microscopy technique used to study surface morphology at nanoscale resolution, especially useful in nanotechnology applications in energy and environment research. AFM works on the principle of interatomic forces between a sharp probe tip and the sample surface. The system mainly consists of a cantilever with a ______ ________ ___ ___ ____ ____ ___.
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