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Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are both electron microscopy techniques used to study the structure and morphology of materials at high resolution, but they differ fundamentally in their imaging mechanisms. SEM uses a focused beam of electrons that scans the surface of a sample, producing secondary electrons, backscattered electrons, and characteristic X-rays, which provide information about surface topography, composition, _________ _____ ______ _____ _________ ______ _____ ______ _________ _______ _________.
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