Discuss basic theory and application of Atomic force Microscopy.

Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows for the study of surfaces at the nanoscale. It operates by scanning a sharp tip, typically made of silicon or silicon nitride, over the surface of a sample. The tip is mounted on a flexible cantilever, and as it interacts with the sample, various forces—such as van der Waals forces, _________ _______ ____ _______ ______ _______ ________ ______ ___ _____ _________ _____.
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