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Scanning Electron Microscopy (SEM) is an advanced imaging technique widely used in nanotechnology for studying the surface morphology and microstructure of materials. In SEM, a focused beam of high-energy electrons is scanned across the surface of a specimen. When these electrons interact with the sample, various signals are emitted, including secondary electrons, backscattered electrons, and X-rays. Secondary electrons provide detailed topographical images, _________ ___ ______ ______ ________ _______ ______ ___ _____ ___.
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